The world’s first benchtop platform for X-ray powder diffraction in reflection and transmission geometry, thin film analysis by grazing incidence diffraction and reflectometry, and bulk sample stress and texture analysis.
This innovative benchtop platform is the first to combine a full suite of X-ray analysis capabilities into a single, compact system. It allows for advanced X-ray powder diffraction in both reflection and transmission modes,, sophisticated thin-film analysis through grazing incidence diffraction and reflectometry, as well as stress and texture analysis on bulk samples. This system makes high-level materials characterization more accessible and convenient than ever before.
